DocumentCode
281631
Title
Reliability in testing techniques for precision Zener diodes
Author
Spreadbury, P.J.
Author_Institution
Dept. of Eng., Cambridge Univ., UK
fYear
1989
fDate
32577
Firstpage
42461
Lastpage
42464
Abstract
A voltage measurement system is described which can measure at the 5 V to 8 V level with a resolution of 1 μV and a long term uncertainty of 3 p.p.m. A microcomputer controls the three stage measurement process incorporating the techniques of a metrology lab. Reliability of measurement is ensured by repeated measurements and by duplicated paths to trace the voltage being measured back to the standards
Keywords
Zener diodes; computerised instrumentation; electronic equipment testing; microcomputer applications; reliability; voltage measurement; 5 to 8 V; precision Zener diodes; voltage measurement;
fLanguage
English
Publisher
iet
Conference_Titel
Reliable Electronic Measurements, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
198012
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