Title :
Testing a multivariate model for wavelet coefficients
Author :
Kwitt, Roland ; Meerwald, Peter ; Uhl, Andreas ; Verdoolaege, Geert
Author_Institution :
Dept. of Comput. Sci., Univ. of Salzburg, Salzburg, Austria
Abstract :
In this paper, we introduce a Goodness-of-Fit test for the Multivariate Exponential Power (MEP) distribution, a multivariate extension of the Generalized Gaussian, which has recently gained considerable interest as a model for wavelet coefficients in the context of color image retrieval and spread-spectrum watermarking. We present a size and power study of this test and show Goodness-of-Fit results for wavelet coefficients of natural and texture images from various popular databases.
Keywords :
Gaussian processes; image colour analysis; image retrieval; color image retrieval; generalized Gaussian; multivariate exponential power distribution; spread-spectrum watermarking; wavelet coefficients; Conferences; Discrete wavelet transforms; Estimation; Monte Carlo methods; Shape; Testing; Vectors; Hypothesis testing; Multivariate modeling; Wavelet transform;
Conference_Titel :
Image Processing (ICIP), 2011 18th IEEE International Conference on
Conference_Location :
Brussels
Print_ISBN :
978-1-4577-1304-0
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2011.6115667
