DocumentCode :
2816480
Title :
An information system for systematic validation of the software used in vehicular microcontrollers
Author :
Bhogaraju, Sudha ; Singh, Gautam B. ; Edwards, Gary ; Limberg, John ; Watson, Mary ; Gobrogge, Scott
Author_Institution :
Dept. of Comput. Sci. & Eng., Oakland Univ., Rochester, MI, USA
fYear :
2000
fDate :
2000
Firstpage :
104
Lastpage :
109
Abstract :
The validation test plans for embedded software need to be very rigorous and thorough. The information technology framework and a vehicle-centered intelligent system presented aims at facilitating this process. This system is designed with the objective of enabling a quantitative determination of the reliability of real-time systems. Software quality metrics are needed in the standardization of software in safety-critical applications, such as those pertaining to the operations of a vehicular microcontroller. A relational DBMS is utilized for a normalized tracking of requirements and the associated tests used in their validation. A granular and non-redundant representation of test-cases enables our system to derive the set of operations that are common to a large number of test-cases. As is demonstrated in this paper these common operations form the basis for test-unification and lead to an automated generation of the singular meta-test cases that are functionally equivalent to two or more lower level test cases
Keywords :
embedded systems; intelligent control; microcontrollers; program testing; program verification; road vehicles; safety-critical software; information system; intelligent system; microcontrollers; real-time systems; relational database; road vehicles; safety-critical applications; software validation; Automatic testing; Embedded software; Information systems; Information technology; Intelligent systems; Intelligent vehicles; Real time systems; Software quality; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Vehicles Symposium, 2000. IV 2000. Proceedings of the IEEE
Conference_Location :
Dearborn, MI
Print_ISBN :
0-7803-6363-9
Type :
conf
DOI :
10.1109/IVS.2000.898326
Filename :
898326
Link To Document :
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