DocumentCode
2816520
Title
Evaluation of IBM end of life products: measuring DFE effectiveness
Author
Dunnett, Mark ; Grenchus, Ed ; Keene, Robert ; Yehle, Larry ; Jacques, Mary ; Karlsson, Morten ; Kirby, J. Ray ; Pitts, Dewey
Author_Institution
Asset Recovery Center, IBM Corp., Endicott, NY, USA
fYear
1999
fDate
1999
Firstpage
98
Lastpage
103
Abstract
IBM products targeted for design for the environment (DFE) initiatives in the IBM ECP program are beginning to arrive at the IBM Asset Recovery Center (ARC) in Endicott, New York. For the first time, it is now possible to evaluate the DFE attributes of machines based upon actual product end-of-life (EOL) data. Using demanufacturing information gathered at IBM Endicott ARC, this paper couples some of the key actions (cause) initiated by the ECECP and results (effect) as measured by the ARC on returned products. The results of these studies clearly demonstrate IBM´s success in implementing targeted DFE attributes defined within its Environmentally Conscious Products (ECP) program. This paper presents results obtained from a project where DFE and dismantling performance were evaluated on a wide range of product types varying in age from one to fifteen years old. It analyzes the data and links the findings to DFE initiatives taken within the ECP program or other contributing factors having an impact on product recyclability
Keywords
design for environment; mainframes; microcomputers; Endicott; Environmentally Conscious Products program; IBM Asset Recovery Center; IBM ECP program; IBM end of life products evaluation; IBM products; New York; demanufacturing information; design for environment effectiveness measurement; mainframes; mid-range systems; personal computers; product end-of-life data; product recyclability; Data analysis; Design engineering; Guidelines; Manufacturing; Procurement; Product design; Product development; Production facilities; Recycling; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and the Environment, 1999. ISEE -1999. Proceedings of the 1999 IEEE International Symposium on
Conference_Location
Danvers, MA
Print_ISBN
0-7803-5495-8
Type
conf
DOI
10.1109/ISEE.1999.765856
Filename
765856
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