Title :
Strontium optical lattice clock: 10−16 uncertainty
Author :
Ludlow, A.D. ; Campbell, G.K. ; Blatt, S. ; Boyd, M.M. ; Zelevinsky, T. ; Martin, M.J. ; De Miranda, M. H G ; Thomsen, J.W. ; Ye, Jun ; Fortier, T.M. ; Stalnaker, J.E. ; Diddams, S.A. ; Oates, C.W.
Author_Institution :
Dept. of Phys., Colorado Univ., Boulder, CO
Abstract :
We report on the improved characterization and operation of an optical frequency standard based on nuclear-spin-polarized, ultracold neutral strontium confined in a one dimensional optical lattice. We implement a remote optical carrier phase link between JILA and NIST Boulder campus, permitting high precision evaluation of the Sr system with other optical standards. Frequency measurement against a free-space Ca standard enables determination of systematic shifts of the Sr standard at or below 1 x 10-16 fractional uncertainty. We observe a density-dependent shift of the clock transition and its dependence on excited state fraction, with a zero crossing of the shift. We perform a 50-hour-long absolute frequency measurement of the strontium transition referenced to the NIST-F1 Cs fountain standard. This yields a value for the Sr clock transition frequency with a fractional uncertainty of 8.6 x 10-16, limited by the H-maser and Cs standards used. This represents our fifth, and the most accurate, measurement of the 87Sr clock frequency.
Keywords :
atomic clocks; frequency measurement; frequency standards; laser cooling; masers; measurement uncertainty; optical lattices; strontium; H-maser; JILA; NIST Boulder Campus; clock transition; density-dependent shift; fractional uncertainty; frequency measurement; measurement uncertainty; nuclear-spin-polarization; one dimensional optical lattice; optical frequency standard; remote optical carrier phase link; strontium optical lattice clock; ultracold neutral strontium; Atom optics; Atomic measurements; Clocks; Frequency measurement; Lattices; Measurement standards; NIST; Optical sensors; Strontium; Uncertainty;
Conference_Titel :
Frequency Control Symposium, 2008 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1794-0
Electronic_ISBN :
1075-6787
DOI :
10.1109/FREQ.2008.4623037