Title :
All optical characterization of MMICs
Author :
Riaziat, M. ; Weingarten, K. ; Generali, L. ; Gerstenberger, D. ; Drobshoff, A. ; Ching, L.Y.
Author_Institution :
Varian Res. Center, Palo Alto, CA, USA
Abstract :
Microwave, frequency-domain measurements using optical beams to both deliver the excitation and measure the circuit response are demonstrated on monolithic microwave integrated circuits (MMICs). A modulated diode laser delivers the microwave excitation up to 10 GHz to an integrated MSM (metal semiconductor metal) photodetector driving a MMIC amplifier. The circuit´s small-signal response is measured with another laser using electrooptic (EO) sampling. Excitation at frequencies above 10 GHz is demonstrated using the output of two frequency-doubled single frequency lasers mixed together to produce a microwave beat signal.<>
Keywords :
MMIC; frequency-domain analysis; integrated circuit testing; measurement by laser beam; microwave amplifiers; MMICs; MSM photodetector; electro-optic sampling; frequency-domain measurements; frequency-doubled single frequency lasers; microwave beat signal; modulated diode laser; monolithic microwave integrated circuits; small-signal response; Frequency measurement; Integrated circuit measurements; Laser excitation; Lasers and electrooptics; MMICs; Masers; Microwave measurements; Optical modulation; Semiconductor lasers; Semiconductor optical amplifiers;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990., 12th Annual
Conference_Location :
New Orleans, LA, USA
DOI :
10.1109/GAAS.1990.175526
