Title :
VEHIL: a full-scale test methodology for intelligent transport systems, vehicles and subsystems
Author :
Verhoeff, L. ; Verburg, D.J. ; Lupker, H.A. ; Kusters, L.J.J.
Author_Institution :
Dept. of Vehicle Dynamics, TNO Autom., Delft, Netherlands
Abstract :
To enhance the efficiency and safety of today´s road transport the application of driver support systems and fully automated, intelligent transport systems becomes increasingly important. The safety and reliability requirements of these systems and their complexity are high, which results in a costly, time consuming development and testing process. The paper presents an intelligent vehicle hardware in the loop simulator for faster and more efficient development and testing of full-scale intelligent vehicle and transport systems. Its technical feasibility and added value are illustrated by applying the concept to a passenger car platooning experiment
Keywords :
automated highways; digital simulation; reliability; safety; testing; VEHIL; added value; driver support systems; efficiency; full-scale test methodology; intelligent transport systems; intelligent vehicle hardware in the loop simulator; passenger car platooning experiment; technical feasibility; Automotive engineering; Control systems; Hardware; Intelligent systems; Intelligent vehicles; Performance evaluation; Road safety; System testing; Vehicle dynamics; Vehicle safety;
Conference_Titel :
Intelligent Vehicles Symposium, 2000. IV 2000. Proceedings of the IEEE
Conference_Location :
Dearborn, MI
Print_ISBN :
0-7803-6363-9
DOI :
10.1109/IVS.2000.898371
