• DocumentCode
    2817233
  • Title

    Steep subthreshold slope nanowire nanoelectromechanical field-effect transistors (NW-NEMFETs)

  • Author

    Ji-Hun Kim ; Chen, Zack C. Y. ; Soonshin Kwon ; Jie Xiang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California San Diego, La Jolla, CA, USA
  • fYear
    2013
  • fDate
    28-29 Oct. 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Significant physical challenges remain for CMOS technology to decrease Ioff as transistor dimension and power supply voltages continue downscaling. However, a fundamental thermodynamic limit in the subthreshold slope SS = |(∂Vg)/(∂lnId)| = ln10 · kBT/q at >60 mV/dec exists at room temperature. We have designed and demonstrated the first semiconductor nanowires (NWs) and nanoelectromechanical system (NEMS) field effect transistor structure (NW-NEMFET). We have previously demonstrated 0.5 ps intrinsic delay and near ballistic operation in quantum confined semiconductor heterostructure NWFETs with diameters less than 15 nm.[1] The current design uses high performance suspended semiconductor NWs as the conduction channel, while the electrostatic pull-in of the NW towards the gate stack enables abrupt switching to the off-state leading to high frequency, low power nanoelectronics. Simulation shows that compared to planar suspended-gate FET (SGFET) design [2], NW-NEMFET allows zero SS with 1015 on-off ratio and near 1V pull-in voltage due to enhanced 3D capacitive coupling, as well as operation at very-high-frequency (VHF) and even ultra-high-frequency (UHF) due to the NW beams high aspect ratio and small dimensions.
  • Keywords
    field effect transistors; nanoelectromechanical devices; nanowires; CMOS; conduction channel; electrostatic pull-in; intrinsic delay; near ballistic operation; power supply voltages; quantum confined semiconductor heterostructure; semiconductor nanowires; steep subthreshold slope nanowire nanoelectromechanical field- effect transistors; thermodynamic limit; transistor dimension; Couplings; Electrodes; Electrostatics; Logic gates; Silicon; Three-dimensional displays; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Efficient Electronic Systems (E3S), 2013 Third Berkeley Symposium on
  • Conference_Location
    Berkeley, CA
  • Type

    conf

  • DOI
    10.1109/E3S.2013.6705882
  • Filename
    6705882