• DocumentCode
    2817332
  • Title

    Dynamic noise-feedback and mode-coupling mechanism silences the VCXOs phase noise

  • Author

    Rohde, Ulrich L. ; Poddar, Ajay K.

  • Author_Institution
    Synergy Microwave Corp., Paterson, NJ
  • fYear
    2008
  • fDate
    19-21 May 2008
  • Firstpage
    554
  • Lastpage
    561
  • Abstract
    Reference signal source requires highly quality factor resonating element, such as micro-machined or piezoelectric crystal that acts as an electro-mechanical resonating module in VCXO circuits. Apart from the apparent advantages of these electromechanical resonators they suffer from multi-mode resonance and cross talks. The selection of the desired resonance mode is challenging when the spacing between resonance modes is relatively small. This limits the fabrications of crystal oscillator as a reference sources in modern IC processes. The novel approach (mode-selection and mode-feedback techniques) reported in this paper optimizes the performance of VCXO, even those with relative low Q resonators, for low phase noise and good frequency stability. The typical measured phase noise for 155.6 MHz VCXO is typically - 137 dBc/Hz at 100 Hz offset from the carrier, and to author knowledge, this is the best phase noise performance for this class of VCXO so far reported.
  • Keywords
    crystal oscillators; electromechanical effects; frequency stability; micromechanical resonators; VCXO phase noise; crystal oscillator; dynamic noise-feedback; electro-mechanical resonating module; electromechanical resonators; frequency stability; highly quality factor resonating element; mode-coupling mechanism silences; mode-selection techniques; modern IC processes; piezoelectric crystal; reference signal source; Circuit noise; Fabrication; Frequency; Noise measurement; Oscillators; Phase measurement; Phase noise; Q factor; Resonance; Stability; Electro-Mechanical; IC; Q; VCXO;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 2008 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-1794-0
  • Electronic_ISBN
    1075-6787
  • Type

    conf

  • DOI
    10.1109/FREQ.2008.4623060
  • Filename
    4623060