DocumentCode :
2817356
Title :
Measurement and test techniques in production of precision frequency control devices
Author :
Ma, Jinglu ; Zhou, Wei ; Liu, Yongbo ; Jia, Zhaomin ; Wang, Hai ; Zou, Chengzhi ; Yu, Ming
Author_Institution :
54th Res. Inst., China Electron. Technol. Group Corp., Xian
fYear :
2008
fDate :
19-21 May 2008
Firstpage :
562
Lastpage :
564
Abstract :
We have researched, developed and applied a series of measuring and testing technologies in the mass production and exploitation of precision frequency control devices including OCXO, TCXO, VCXO, PLL and clock modules. They have shown a key function to the performance improvement and quality guarantee of the products. In this paper we shall present turn point regulation technology and equipment of OCXO, the dynamic storage technology of crystal devices and oscillators, aging and testing techniques of mass precision oscillators, test technique of phase noise, measurement technique of frequency stability in mass production, reliability test technology. The requests include high precision, fast-speed, automated, convenient, and low-cost.
Keywords :
crystal oscillators; frequency control; frequency stability; mass production; phase noise; reliability; OCXO; PLL; TCXO; VCXO; clock module; crystal devices; crystal oscillator; dynamic storage technology; frequency stability; mass production; measurement techniques; phase noise; precision frequency control devices; reliability test technology; testing technology; turn point regulation technology; Aging; Clocks; Frequency control; Frequency measurement; Mass production; Measurement techniques; Oscillators; Phase locked loops; Phase noise; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 2008 IEEE International
Conference_Location :
Honolulu, HI
ISSN :
1075-6787
Print_ISBN :
978-1-4244-1794-0
Electronic_ISBN :
1075-6787
Type :
conf
DOI :
10.1109/FREQ.2008.4623061
Filename :
4623061
Link To Document :
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