Recent Results for PowerPC Processor and Bridge Chip Testing

Author

Guertin, Steven M. ; Irom, Farokh

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

2010

fDate

20-23 July 2010

Firstpage

8

Lastpage

8

Abstract

Recent single event effect (SEE) test results for the Freescale 7447A and IBM 750FX microprocessors, and Marvell 64460 bridge chips are reported. The 7447A and 750FX results are compared to earlier work. The 64460 represents unique data. The data extraction methods for each test type are described. The 7447A and 750FX were found to have a single event upset (SEU) threshold of about 1 MeV-cm²/mg and saturated cross section of 2×10^-9 cm²/bit. Both devices have proton cross sections of about 10^-14 cm²/bit and proton thresholds below 20 MeV. The 64460 was shown to have functional interrupts similar to single event latchup with threshold below 1 MeV-cm²/g and saturated cross section around 1 cm².

Keywords

logic testing; microprocessor chips; radiation effects; Freescale 7447A; IBM 750FX microprocessors; Marvell 64460 bridge chips; PowerPC processor; bridge chip testing; data extraction methods; proton thresholds; saturated cross section; single event effect test results; single event latchup; single event upset threshold; Bridges; Ions; Protons; Radiation effects; Registers; Sensitivity; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop (REDW), 2010 IEEE

Conference_Location

Denver, CO

ISSN

2154-0519

Print_ISBN

978-1-4244-8405-8

Type

conf

DOI

10.1109/REDW.2010.5619489

Filename

5619489