• DocumentCode
    2817424
  • Title

    90-nm Digital Single Event Transient Pulsewidth Measurements

  • Author

    Lawrence, Reed K. ; Ross, Jason F. ; Wood, Neil E.

  • Author_Institution
    BAE Syst., Manassas, VA, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    5
  • Lastpage
    5
  • Abstract
    Single event transient (SET) pulsewidth measurements were made on 9SF 90 nm shift registers built with temporal delay latches on epitaxial substrates. Data was gathered using heavy ions from LETs of 9.75 to 58.78 (MeV-cm2)/mg.
  • Keywords
    logic testing; radiation effects; shift registers; digital single event transient pulsewidth measurements; epitaxial substrates; size 90 nm; temporal delay latches; Delay; Inverters; Latches; Pulse measurements; Registers; Temperature measurement; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619492
  • Filename
    5619492
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817424