Title :
90-nm Digital Single Event Transient Pulsewidth Measurements
Author :
Lawrence, Reed K. ; Ross, Jason F. ; Wood, Neil E.
Author_Institution :
BAE Syst., Manassas, VA, USA
Abstract :
Single event transient (SET) pulsewidth measurements were made on 9SF 90 nm shift registers built with temporal delay latches on epitaxial substrates. Data was gathered using heavy ions from LETs of 9.75 to 58.78 (MeV-cm2)/mg.
Keywords :
logic testing; radiation effects; shift registers; digital single event transient pulsewidth measurements; epitaxial substrates; size 90 nm; temporal delay latches; Delay; Inverters; Latches; Pulse measurements; Registers; Temperature measurement; Transient analysis;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619492
