DocumentCode :
2817424
Title :
90-nm Digital Single Event Transient Pulsewidth Measurements
Author :
Lawrence, Reed K. ; Ross, Jason F. ; Wood, Neil E.
Author_Institution :
BAE Syst., Manassas, VA, USA
fYear :
2010
fDate :
20-23 July 2010
Firstpage :
5
Lastpage :
5
Abstract :
Single event transient (SET) pulsewidth measurements were made on 9SF 90 nm shift registers built with temporal delay latches on epitaxial substrates. Data was gathered using heavy ions from LETs of 9.75 to 58.78 (MeV-cm2)/mg.
Keywords :
logic testing; radiation effects; shift registers; digital single event transient pulsewidth measurements; epitaxial substrates; size 90 nm; temporal delay latches; Delay; Inverters; Latches; Pulse measurements; Registers; Temperature measurement; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
ISSN :
2154-0519
Print_ISBN :
978-1-4244-8405-8
Type :
conf
DOI :
10.1109/REDW.2010.5619492
Filename :
5619492
Link To Document :
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