DocumentCode :
281746
Title :
Aging and self-healing in connectors: implications for accelerated testing
Author :
Williamson, J.B.P.
fYear :
1989
fDate :
32602
Firstpage :
42401
Abstract :
There is now clear evidence that connector behaviour in mid life is much more complicated. Connectors, especially power connectors, undergo periods of self-healing during which: the contact area grows, the resistance falls, and the interface cools. Observations of this phenomenon are described, and an explanation of the behaviour is proposed
fLanguage :
English
Publisher :
iet
Conference_Titel :
Electrical Contacts, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
198165
Link To Document :
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