Title :
Cross Comparison Guide for Results of Neutron SEE Testing of Microelectronics Applicable to Avionics
Author :
Normand, Eugene ; Dominik, Laura
Author_Institution :
Boeing Res. & Technol., Seattle, WA, USA
Abstract :
A cross comparison of SEU, SEFI and SEL responses in >30 devices (SRAMs μprocessors and FPGAs) using different neutron/proton beams leads to observation that SEU and SEFI cross sections from 14 MeV neutrons are within <;2 compared to LANL neutron beam.
Keywords :
SRAM chips; avionics; field programmable gate arrays; integrated circuit testing; neutron beams; proton beams; FPGA; SRAM; avionics; cross comparison guide; microelectronics; neutron SEE testing; neutron/proton beams; single event effects; Field programmable gate arrays; Neutrons; Particle beams; Program processors; Random access memory; Single event upset; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619496
