• DocumentCode
    2817491
  • Title

    Cross Comparison Guide for Results of Neutron SEE Testing of Microelectronics Applicable to Avionics

  • Author

    Normand, Eugene ; Dominik, Laura

  • Author_Institution
    Boeing Res. & Technol., Seattle, WA, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    8
  • Lastpage
    8
  • Abstract
    A cross comparison of SEU, SEFI and SEL responses in >30 devices (SRAMs μprocessors and FPGAs) using different neutron/proton beams leads to observation that SEU and SEFI cross sections from 14 MeV neutrons are within <;2 compared to LANL neutron beam.
  • Keywords
    SRAM chips; avionics; field programmable gate arrays; integrated circuit testing; neutron beams; proton beams; FPGA; SRAM; avionics; cross comparison guide; microelectronics; neutron SEE testing; neutron/proton beams; single event effects; Field programmable gate arrays; Neutrons; Particle beams; Program processors; Random access memory; Single event upset; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619496
  • Filename
    5619496
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817491