Title :
TID and SEE Responses of Rad-Hardened A/D Converters
Author :
Chaumont, Géraldine ; Uguen, André ; Prugne, Christophe ; Malou, Florence
Author_Institution :
STMicroelectronics, Rennes, France
Abstract :
We present Single Event Effects characterization and Total Ionizing Dose behaviour up to 300 krad(Si) on Rad-Hardened A/D converter.
Keywords :
analogue-digital conversion; radiation hardening (electronics); SEE response; rad-hardened A/D converters; single event effects; total ionizing dose; Annealing; Linearity; NASA; Radiation effects; Signal to noise ratio; Single event upset;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619500
