• DocumentCode
    2817578
  • Title

    TID and SEE Responses of Rad-Hardened A/D Converters

  • Author

    Chaumont, Géraldine ; Uguen, André ; Prugne, Christophe ; Malou, Florence

  • Author_Institution
    STMicroelectronics, Rennes, France
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    5
  • Lastpage
    5
  • Abstract
    We present Single Event Effects characterization and Total Ionizing Dose behaviour up to 300 krad(Si) on Rad-Hardened A/D converter.
  • Keywords
    analogue-digital conversion; radiation hardening (electronics); SEE response; rad-hardened A/D converters; single event effects; total ionizing dose; Annealing; Linearity; NASA; Radiation effects; Signal to noise ratio; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619500
  • Filename
    5619500
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817578