DocumentCode
2817627
Title
An effect of size fluctuation on photoluminescence peak width of closely stacked InAs self-assembled quantum dot structures
Author
Endoh, Akira ; Nakata, Yoshiaki ; Sugiyama, Yoshihiro ; Takatsu, Motomu ; Yokoyama, Naoki
Author_Institution
Fujitsu Labs. Ltd., Atsugi, Japan
fYear
1998
fDate
11-15 May 1998
Firstpage
167
Lastpage
170
Abstract
We studied the effect of size fluctuations on the photoluminescence (PL) peak widths of closely stacked InAs self-assembled quantum dot structures. We calculated the PL spectra of InAs quantum dot structures using three models based on the effective mass approximation method and compared them with experimental values. Our calculations showed that the PL peak width is predominantly determined by height fluctuations. We obtained the dependence of the full width at half maximum (FWHM) on the intermediate layer thickness d for 2-layer stacked structures from d=2 nm to 6 nm to clarify effect of vertical coupling. The FWHM increases with a decreasing d. A decrease of FWHM with a decreasing d is seen in the region where the number of vertically connected islands increases. We observed a very sharp PL peak for a 3-layer stacked structure, which is attributable to an extremely reduced island height fluctuation as well as vertical coupling
Keywords
III-V semiconductors; effective mass; indium compounds; photoluminescence; semiconductor quantum dots; size effect; 2 to 6 nm; 2-layer stacked structures; InAs; closely stacked InAs self-assembled quantum dot structures; effective mass approximation method; height fluctuations; photoluminescence peak width; size fluctuation; vertical coupling; vertically connected islands; Approximation methods; Effective mass; Energy states; Fluctuations; Gallium arsenide; Molecular beam epitaxial growth; Photoluminescence; Quantum dot lasers; Quantum dots; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location
Tsukuba
ISSN
1092-8669
Print_ISBN
0-7803-4220-8
Type
conf
DOI
10.1109/ICIPRM.1998.712428
Filename
712428
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