• DocumentCode
    2817627
  • Title

    An effect of size fluctuation on photoluminescence peak width of closely stacked InAs self-assembled quantum dot structures

  • Author

    Endoh, Akira ; Nakata, Yoshiaki ; Sugiyama, Yoshihiro ; Takatsu, Motomu ; Yokoyama, Naoki

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • fYear
    1998
  • fDate
    11-15 May 1998
  • Firstpage
    167
  • Lastpage
    170
  • Abstract
    We studied the effect of size fluctuations on the photoluminescence (PL) peak widths of closely stacked InAs self-assembled quantum dot structures. We calculated the PL spectra of InAs quantum dot structures using three models based on the effective mass approximation method and compared them with experimental values. Our calculations showed that the PL peak width is predominantly determined by height fluctuations. We obtained the dependence of the full width at half maximum (FWHM) on the intermediate layer thickness d for 2-layer stacked structures from d=2 nm to 6 nm to clarify effect of vertical coupling. The FWHM increases with a decreasing d. A decrease of FWHM with a decreasing d is seen in the region where the number of vertically connected islands increases. We observed a very sharp PL peak for a 3-layer stacked structure, which is attributable to an extremely reduced island height fluctuation as well as vertical coupling
  • Keywords
    III-V semiconductors; effective mass; indium compounds; photoluminescence; semiconductor quantum dots; size effect; 2 to 6 nm; 2-layer stacked structures; InAs; closely stacked InAs self-assembled quantum dot structures; effective mass approximation method; height fluctuations; photoluminescence peak width; size fluctuation; vertical coupling; vertically connected islands; Approximation methods; Effective mass; Energy states; Fluctuations; Gallium arsenide; Molecular beam epitaxial growth; Photoluminescence; Quantum dot lasers; Quantum dots; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1998 International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-4220-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1998.712428
  • Filename
    712428