Title :
Total Dose and Single Event Testing of a Hardened Single-Ended Current Mode PWM Controller
Author :
van Vonno, N.W. ; Pearce, L.G. ; Wood, G.M. ; White, J.D. ; Thomson, E.J. ; Bernard, T.M. ; Chesley, P.J. ; Hood, R.
Author_Institution :
Intersil Corp., Melbourne, FL, USA
Abstract :
We report results of total dose and SEE testing of the ISL7884xASRH hardened single-ended current mode PWM controller including discussion of part design, process and radiation testing results. The part is implemented in submicron BiCMOS.
Keywords :
BiCMOS integrated circuits; PWM power convertors; integrated circuit testing; BiCMOS; ISL7884xASRH; SEE testing; hardened single-ended current mode PWM controller; process testing; radiation testing; single event testing; total dose testing; Converters; Ions; Pulse width modulation; Radiation effects; Testing; Transient analysis; Voltage control;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619502
