• DocumentCode
    2817672
  • Title

    Radiation Test of 8 Bit Microcontrollers ATmega128 & AT90CAN128

  • Author

    Schüttauf, A. ; Rakers, S. ; Daniel, C.

  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    4
  • Lastpage
    4
  • Abstract
    We have performed heavy ion tests of the ATmega128 and AT90CAN128 micro controller. These COTS devices have shown a quite different sensitivity to SEL/SEU errors, where the current consumption showed a step like behaviour. Detailed measurements, analyses and on-orbit rates are presented.
  • Keywords
    integrated circuit testing; microcontrollers; radiation; AT90CAN128; ATmega128; SEL/SEU errors; heavy ion tests; microcontrollers; radiation test; word length 8 bit; Aerospace electronics; Current measurement; Microcontrollers; Power supplies; Radiation effects; Random access memory; Relays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619504
  • Filename
    5619504
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817672