Title :
Radiation Test of 8 Bit Microcontrollers ATmega128 & AT90CAN128
Author :
Schüttauf, A. ; Rakers, S. ; Daniel, C.
Abstract :
We have performed heavy ion tests of the ATmega128 and AT90CAN128 micro controller. These COTS devices have shown a quite different sensitivity to SEL/SEU errors, where the current consumption showed a step like behaviour. Detailed measurements, analyses and on-orbit rates are presented.
Keywords :
integrated circuit testing; microcontrollers; radiation; AT90CAN128; ATmega128; SEL/SEU errors; heavy ion tests; microcontrollers; radiation test; word length 8 bit; Aerospace electronics; Current measurement; Microcontrollers; Power supplies; Radiation effects; Random access memory; Relays;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619504
