• DocumentCode
    2817730
  • Title

    Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

  • Author

    Cochran, Donna J. ; Chen, Dakai ; Oldham, Timothy R. ; Sanders, Anthony B. ; Kim, Hak S. ; Campola, Michael J. ; Buchner, Stephen P. ; LaBel, Kenneth A. ; Marshall, Cheryl J. ; Pellish, Jonathan A. ; Carts, Martin A. ; Bryan, Martha V O

  • Author_Institution
    MEI Technol., Inc., Greenbelt, MD, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    8
  • Lastpage
    8
  • Abstract
    Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
  • Keywords
    failure analysis; ionisation; radiation effects; space vehicles; NASA; candidate spacecraft electronics; displacement damage compendium; ionizing dose; Breakdown voltage; CMOS integrated circuits; CMOS technology; Degradation; NASA; Protons; Radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619507
  • Filename
    5619507
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817730