Title :
Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
Author :
Cochran, Donna J. ; Chen, Dakai ; Oldham, Timothy R. ; Sanders, Anthony B. ; Kim, Hak S. ; Campola, Michael J. ; Buchner, Stephen P. ; LaBel, Kenneth A. ; Marshall, Cheryl J. ; Pellish, Jonathan A. ; Carts, Martin A. ; Bryan, Martha V O
Author_Institution :
MEI Technol., Inc., Greenbelt, MD, USA
Abstract :
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
Keywords :
failure analysis; ionisation; radiation effects; space vehicles; NASA; candidate spacecraft electronics; displacement damage compendium; ionizing dose; Breakdown voltage; CMOS integrated circuits; CMOS technology; Degradation; NASA; Protons; Radiation effects;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619507
