DocumentCode :
2817770
Title :
Performance of Commercial Off-the-Shelf Microelectromechanical Systems Sensors in a Pulsed Reactor Environment
Author :
Holbert, Keith E. ; Heger, A. Sharif ; McCready, Steven S.
Author_Institution :
Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
2010
fDate :
20-23 July 2010
Firstpage :
8
Lastpage :
8
Abstract :
Prompted by the unexpected failure of piezoresistive sensors in both an elevated gamma-ray environment and reactor core pulse tests, we initiated radiation testing of several MEMS piezoresistive accelerometers and pressure transducers to ascertain their radiation hardness. Some commercial off-the-shelf sensors are found to be viable options for use in a high-energy pulsed reactor, but others suffer severe degradation and even catastrophic failure. Although researchers are promoting the use of MEMS devices in radiation-harsh environment, we nevertheless find assurance testing necessary.
Keywords :
accelerometers; microsensors; piezoresistive devices; pressure transducers; MEMS piezoresistive accelerometers; commercial off-the-shelf microelectromechanical systems sensors; elevated gamma-ray environment; piezoresistive sensors; pressure transducers; pulsed reactor environment; radiation hardness; radiation testing; reactor core pulse tests; unexpected failure; Accelerometers; Inductors; Micromechanical devices; Piezoresistance; Sensors; Testing; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
ISSN :
2154-0519
Print_ISBN :
978-1-4244-8405-8
Type :
conf
DOI :
10.1109/REDW.2010.5619509
Filename :
5619509
Link To Document :
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