• DocumentCode
    2817804
  • Title

    Radiation Hardness Characterization of a 130nm ASIC Library Technology

  • Author

    Dumitru, Radu ; Hafer, Craig ; Wu, Tzu-Wen ; Rominger, Rob ; Gardner, Harry ; Millike, Peter ; Bruno, Kevin ; Farris, Teresa

  • Author_Institution
    Aeroflex Colorado Springs, Colorado Springs, CO, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    5
  • Lastpage
    5
  • Abstract
    Radiation hardness characterization has been performed on a RadHard-by-Design ASIC Library designed using a 130nm commercial fab process. Test chip results are presented illustrating the ASIC library performance and radiation hardness response.
  • Keywords
    application specific integrated circuits; integrated circuit design; integrated circuit testing; radiation hardening (electronics); RadHard-by-Design ASIC Library; chip testing; fab process; radiation hardness characterization; radiation hardness response; size 130 nm; wafer fabrication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619510
  • Filename
    5619510
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817804