DocumentCode
2817813
Title
Chi-square unbiased risk estimate for denoising magnitude MR images
Author
Luisier, Florian ; Wolfe, Patrick J.
Author_Institution
Stat. & Inf. Sci. Lab., Harvard Univ., Cambridge, MA, USA
fYear
2011
fDate
11-14 Sept. 2011
Firstpage
1561
Lastpage
1564
Abstract
In this article we develop Stein-type results for unbiased estimation of the risk associated with parametric estimators of the noncentrality parameter of chi-squared random variables on two degrees of freedom. These results allow for estimator adaptivity, and thus can be used to optimize the parameters of a broad class of typical denoising functions, subject only to weak smoothness assumptions. We show how to apply these results to the problem of enhancing magnitude magnetic resonance images, which are known to be corrupted by Rician noise. As an example, we propose a transform-domain point-wise estimator based on linear expansion of thresholds. Finally, we apply this estimator to synthetic and real image data in conjunction with the undecimated Haar wavelet transform, and conclude that it is able to outperform previous wavelet-based techniques and compares favorably with a more recent approach based on non-local means.
Keywords
Haar transforms; biomedical MRI; image denoising; image enhancement; medical image processing; parameter estimation; wavelet transforms; Rician noise; chi-square unbiased risk estimation; chi-squared random variables; estimator adaptivity; magnitude MR image denoising; magnitude magnetic resonance image enhancement; noncentrality parameter; parameter optimization; parametric estimator; transform-domain point-wise estimator; undecimated Haar wavelet transform; Biomedical imaging; Noise; Noise measurement; Noise reduction; Rician channels; Transforms; Vectors; Chi-square; Image denoising; Magnetic resonance; Rician noise; Shrinkage estimator; Unbiased MSE estimate;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2011 18th IEEE International Conference on
Conference_Location
Brussels
ISSN
1522-4880
Print_ISBN
978-1-4577-1304-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2011.6115745
Filename
6115745
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