Title :
Hardening of Texas Instruments´ VC33 DSP
Author :
Fuller, Robert ; Morris, Wesley ; Gifford, David ; Lowther, Rex ; Gwin, Jon ; Salzman, James ; Alexander, David ; Hunt, Ken
Author_Institution :
Silicon Space Technol., Austin, TX, USA
Abstract :
A hardened version of Texas Instruments´´ VC33 Digital Signal Processor was created without any mask changes. The commercial mask set was processed using Silicon Space Technology´´s HardSIL™ process variant to produce the hardened version. Radiation testing of the resulting hardened circuit demonstrated significant improvement in performance.
Keywords :
digital signal processing chips; hardening; integrated circuit testing; masks; radiation effects; DSP; HardSIL; Silicon Space Technology; Texas Instruments; VC33 digital signal processor; mask; radiation testing; Digital signal processing; Hardware; Instruments; Radiation hardening; Silicon; Software; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619513
