DocumentCode :
2817851
Title :
Composite channel HEMTs for millimeter-wave power applications
Author :
Chevalier, P. ; Wallart, X. ; Mollot, F. ; Bonte, B ; Fauquembergue, R.
Author_Institution :
CNRS, Inst. d´´Electron. et de Microelectron. du Nord, Villeneuve d´´Ascq, France
fYear :
1998
fDate :
11-15 May 1998
Firstpage :
207
Lastpage :
210
Abstract :
The InGaAs-InP composite channel HEMT is an interesting way to overcome the strong impact ionization in the InGaAs channel which is one of the main limitations of InP based HEMT. We present in this paper an experimental quantification of improvements provided by a composite channel. Using an InGaAs/InP composite channel, device output conductance was reduced from 145 mS/mm to 85 mS/mm, transconductance was enhanced from 1 S/mm to 1.2 S/mm and cut-off frequency fMAX increased by 50%. Influence of the feedback capacitance on RF performance has also been investigated through the comparison of passivated and nonpassivated devices. So, 0.15 μm gate length InGaAsInP composite channel HEMT show an fT of 151 GHz and an fMAX of 225 GHz. We also present state of the art power performance at 60 GHz of an InGaAs/InP/n+-InP composite channel HEMT which exhibits an output power density of 355 mW/mm, 12% power-added-efficiency (PAE) and 6.2 dB of linear gain
Keywords :
III-V semiconductors; capacitance; electrical conductivity; feedback; gallium arsenide; impact ionisation; indium compounds; millimetre wave field effect transistors; millimetre wave power transistors; power HEMT; semiconductor device measurement; 0.15 mum; 1 to 1.2 S/mm; 12 percent; 151 GHz; 225 GHz; 6.2 dB; 60 GHz; 85 to 145 mS/mm; InGaAs-InP; InGaAs/InP composite channel HEMT; RF performance; composite channel; composite channel HEMTs; cut-off frequency; feedback capacitance; impact ionization; linear gain; millimeter-wave power applications; nonpassivated devices; output conductance; output power density; passivated devices; power-added-efficiency; transconductance; Capacitance; Cutoff frequency; Feedback; HEMTs; Impact ionization; Indium gallium arsenide; Indium phosphide; MODFETs; Radio frequency; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location :
Tsukuba
ISSN :
1092-8669
Print_ISBN :
0-7803-4220-8
Type :
conf
DOI :
10.1109/ICIPRM.1998.712438
Filename :
712438
Link To Document :
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