• DocumentCode
    2817879
  • Title

    A Multi-Physics Finite Element Model of a 35A Automotive Connector Including Multiscale Rough Surface Contact

  • Author

    Angadi, Santosh V. ; Jackson, Robert L. ; Choe, Song-Yul ; Flowers, George T. ; Lee, Bong-Yi ; Zhong, Liang

  • Author_Institution
    Center for Adv. Vehicle & Extreme Environ. Electron., Auburn Univ., Auburn, AL, USA
  • fYear
    2010
  • fDate
    4-7 Oct. 2010
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    Electrical contacts influence the reliability and performance of relays, electrical connectors, high power connectors, and similar systems, and are therefore a key region which needs to be considered. In the current study, a new inclusive multi-physics (involving mechanical, thermal and electrical fields) finite element model (FEM) of a 35A automotive connector has been developed. The contact resistance is predicted using a multiscale rough surface contact method and is embedded in the multi-physics FEM. The coupled connector model is solved to obtain stresses, contact pressures, electrical and thermal contact resistances, voltage, current density and temperature distributions. The results for the present connector show that the current conducts through a small volume of the connector and more optimal designs are possible that better use the connector material. The model is a powerful tool that can be used for the basic connector characterization, prototype evaluation and design through various material properties and surface finishes.
  • Keywords
    automotive components; contact resistance; electrical contacts; finite element analysis; 35A automotive connector; contact resistance; coupled connector model; electrical contacts; multi-physics finite element model; multiscale rough surface contact; Connectors; Contacts; Materials; Mathematical model; Rough surfaces; Surface resistance; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
  • Conference_Location
    Charleston, SC
  • ISSN
    1062-6808
  • Print_ISBN
    978-1-4244-8174-3
  • Type

    conf

  • DOI
    10.1109/HOLM.2010.5619515
  • Filename
    5619515