• DocumentCode
    2817976
  • Title

    First-Principle Computation of Relaxation Times in Semiconductors for Low and High Electric Fields

  • Author

    Brugger, Simon C. ; Schenk, Andreas

  • Author_Institution
    Integrated Systems Laboratory, Swiss Fed. Inst. of Technology, Gloriastr. 35, CH-8092 Zürich, Switzerland. e-mail: brugger@iis.ee.ethz.ch, Tel: +41 44 632 2348, Fax +41 44 632 1194
  • fYear
    2005
  • fDate
    01-03 Sept. 2005
  • Firstpage
    151
  • Lastpage
    154
  • Abstract
    In this paper we present a method to compute exact relaxation times for any moments of the Boltzmann equation. The method is valid for any electric field and is particularly useful in the case of vanishingly small field intensities. After a theoretical explanation, the method is applied to a full-band model for electrons and holes in silicon. A strong dependence of the relaxation times on the doping concentration is shown, which is in contradictions to popular beliefs.
  • Keywords
    Boltzmann equation; Charge carrier processes; Distributed computing; Distribution functions; Doping; Hydrodynamics; ISO; Laboratories; Semiconductor process modeling; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on
  • Print_ISBN
    4-9902762-0-5
  • Type

    conf

  • DOI
    10.1109/SISPAD.2005.201495
  • Filename
    1562047