• DocumentCode
    2818035
  • Title

    Carrier transport effects in 1.3 μm MQW InGaAsP laser design

  • Author

    Silfvenius, Christofer ; Landgren, Gunnar

  • Author_Institution
    Dept. of Electron., R. Inst. of Technol., Stockholm, Sweden
  • fYear
    1998
  • fDate
    11-15 May 1998
  • Firstpage
    250
  • Lastpage
    253
  • Abstract
    We have investigated the influence of the barrier height on the performance of InGaAsP MQW lasers emitting at 1.3 μm via simulations, direct hole transport time measurements and laser evaluation. The results from the simulation showed that too high barriers will result in an increase in hole and electron concentrations at the p-side of the MQW. This leads to a severe increase in the Auger recombination rate. The measured hole transport time is clearly dependent on the barrier height in the MQW. MOVPE-fabricated lasers with up to twelve periods and optimised barrier heights showed internal efficiency values above 95%, internal losses below 10 cm-1, threshold densities as low as 60 Acm-2/well and T0 values as high as 79 K in the temperature range 20-80°C. Our conclusion is that attention should be given to the valence band carrier distribution when designing for low threshold, high optical output MQW lasers aimed for elevated temperature operation
  • Keywords
    Auger effect; III-V semiconductors; electron density; electron-hole recombination; gallium arsenide; gallium compounds; hole density; indium compounds; quantum well lasers; semiconductor epitaxial layers; 1.3 mum; 20 to 80 degC; Auger recombination rate; InGaAsP; MOVPE; MQW lasers; barrier height; electron concentration; hole concentration; hole transport time; internal efficiency; internal losses; laser design; Capacitive sensors; Epitaxial growth; Epitaxial layers; Laser theory; Optical design; Quantum well devices; Radiative recombination; Semiconductor lasers; Temperature; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1998 International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-4220-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1998.712449
  • Filename
    712449