DocumentCode :
2818089
Title :
Three-Dimensional Structural Transition of Tin Plated Fretting Contacts
Author :
Ito, Tetsuya ; Ogihara, Shigeru ; Hattori, Yasuhiro
Author_Institution :
Circuits & Connection R&D Div., AutoNetworks Technol., Ltd., Suzuka, Japan
fYear :
2010
fDate :
4-7 Oct. 2010
Firstpage :
1
Lastpage :
6
Abstract :
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion seems to become a serious problem in the future. In a previous study by the authors, three-dimensional SEM observations of tin plated fretting contacts using FIB (Focused Ion Beam)-SEM method have been conducted at the 1st peak contact resistance points of tin plating thickness 1 and 5 μm. In this report, three-dimensional SEM observations have been made for tin plated fretting contacts before and during the contact resistance increase with tin plating thickness 1 and 5 μm. With these observations, the three dimensional structural transition from tin to tin oxide have been confirmed quantitatively. Based on these observation results, the conductive mechanism of a degraded tin plated contact interface in terms of percolation conduction has been considered.
Keywords :
automobiles; contact resistance; corrosion; electric connectors; electrical contacts; electroplating; focused ion beam technology; percolation; scanning electron microscopy; tin alloys; wear; wiring; FIB; automobiles; conductive mechanism; contact failure; degraded tin plated contact interface; electronic equipment; focused ion beam-SEM method; fretting corrosion; installation space; miniaturize wiring harness connectors; peak contact resistance; percolation conduction; three-dimensional SEM observations; three-dimensional structural transition; tin plated fretting contacts; tin plating thickness; Compounds; Contact resistance; Corrosion; Image color analysis; Intermetallic; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
Conference_Location :
Charleston, SC
ISSN :
1062-6808
Print_ISBN :
978-1-4244-8174-3
Type :
conf
DOI :
10.1109/HOLM.2010.5619526
Filename :
5619526
Link To Document :
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