DocumentCode :
2818122
Title :
Deposition of Ti-Si-C-Ag Nanocomposite Coatings as Electrical Contact Material
Author :
Lauridsen, Jonas ; Lu, Jun ; Eklund, Per ; Hultman, Lars ; Öberg, Åke ; Lindgren, Mats ; Fast, Lars ; Lewin, Erik ; Jansson, Ulf
Author_Institution :
Dept. of Phys., Linkoping Univ., Linköping, Sweden
fYear :
2010
fDate :
4-7 Oct. 2010
Firstpage :
1
Lastpage :
7
Abstract :
This paper is a brief review of our recent work and a follow up study on nanocomposite coatings comprising nanocrystalline TiC embedded in an amorphous SiC matrix (nc-TiC/a-SiC) with and without Ag additions applied as electrical contacts. These coating materials are deposited at very high deposition rates (>10 μm/h), to meet industrial demands of high productivity. Here we consider Ti-Si-C-Ag nanocomposite coatings with Ag content in the range of 0-22 at.% deposited in a pilot-plant or an industrial deposition system by dc magnetron sputtering from compound targets onto Si(100) and SiO2(100) substrates. The microstructure, electrical, and mechanical properties of the coatings were studied with transmission electron microscopy, X-ray diffraction, X-ray photoelectron spectroscopy, electrical contact resistance, resistivity, and nanoindentation measurements. Varying the deposition parameters bias and pressure within ranges typical of coating processing had no effect on the structure. A variation was, however, observed for the contact resistance, that was determined to be in the range 400-900 mΩ at a contact force between 1.9-2.65 N. The coatings with highest Ag content had the lowest contact resistance.
Keywords :
coating techniques; contact resistance; electrical contacts; nanocomposites; sputtered coatings; titanium compounds; DC magnetron sputtering; Ti-Si-C-Ag; amorphous SiC matrix; contact resistance; deposition; electrical contact material; electrical contacts; nanocomposite coatings; nanocrystalline; Coatings; Contact resistance; Electrical resistance measurement; Gold; Substrates; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
Conference_Location :
Charleston, SC
ISSN :
1062-6808
Print_ISBN :
978-1-4244-8174-3
Type :
conf
DOI :
10.1109/HOLM.2010.5619528
Filename :
5619528
Link To Document :
بازگشت