• DocumentCode
    2818182
  • Title

    Characterization Techniques for Nanostructured Contact Materials

  • Author

    Braunovic, M.

  • Author_Institution
    MB Interface Inc., Montreal, QC, Canada
  • fYear
    2010
  • fDate
    4-7 Oct. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Testing methods that can be used for characterization of nanostructured contact materials, which result from many of the processing routes for preparation and evaluation of nanocrystalline materials, are reviewed.
  • Keywords
    electrical contacts; nanostructured materials; characterization technique; nanocrystalline material; nanostructured contact material; Force; Materials; Microscopy; Probes; Surface topography; Thermal conductivity; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
  • Conference_Location
    Charleston, SC
  • ISSN
    1062-6808
  • Print_ISBN
    978-1-4244-8174-3
  • Type

    conf

  • DOI
    10.1109/HOLM.2010.5619531
  • Filename
    5619531
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2818182