Title :
Fault finding in analogue circuits
Author :
Wakeling, A.J. ; McKeon, A.
Author_Institution :
Schlumberger Technol., ATE Div., London, UK
Abstract :
Describes work to develop methods for detecting and locating faults in analogue circuits which use minimal probing and only voltage measurements. The method developed uses only descriptions of the correct behaviour so that provided the description is appropriately constrained, any type of fault is detectable
Keywords :
analogue circuits; automatic testing; circuit analysis computing; electronic equipment testing; fault location; analogue circuits; correct behaviour; fault detection; fault finding; fault location; minimal probing; voltage measurements;
Conference_Titel :
Expert Systems for Fault Diagnosis in Engineering Applications, IEE Colloquium on
Conference_Location :
London
