• DocumentCode
    2818437
  • Title

    Comprehensive numerical model for Phase-Change Memory simulations

  • Author

    Redaelli, A. ; Lacaita, A.L. ; Benvenuti, A. ; Pirovano, A.

  • Author_Institution
    DEI, Politecnico di Milano, Milano, Italy
  • fYear
    2005
  • fDate
    01-03 Sept. 2005
  • Firstpage
    279
  • Lastpage
    282
  • Abstract
    A "multi-physics" numerical model that couples a detailed electrical description with the heat equation and with a microscopic picture of the phase transition dynamics is presented. This model, implemented in a three dimensional semiconductor device solver, correctly reproduces the electronic switching effect in the amorphous chalcogenide alloy and the phase-transitions dynamics, providing steady-state and transient simulation results in good agreement with experimental data.
  • Keywords
    Active matrix technology; Amorphous materials; Crystallization; Nonvolatile memory; Numerical models; Phase change materials; Phase change memory; Resistance heating; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on
  • Print_ISBN
    4-9902762-0-5
  • Type

    conf

  • DOI
    10.1109/SISPAD.2005.201527
  • Filename
    1562079