• DocumentCode
    2818691
  • Title

    A Reliability Study of a New Nanocrystalline Nickel Alloy Barrier Layer for Electrical Contacts

  • Author

    Do, Trent K. ; Lund, Alan

  • Author_Institution
    Amphenol TCS, Nashua, NH, USA
  • fYear
    2010
  • fDate
    4-7 Oct. 2010
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper will present a reliability study of a new nanocrystalline nickel alloy undercoating barrier layer for electrical contacts. The new barrier layer material presented in the paper will be shown to be a viable alternative to the industry standard nickel sulfamate undercoating layer which has been the standard barrier layer in the electronics industry for electrical contacts for many decades. While nickel sulfamate has proven to be a reasonably effective barrier layer against both corrosion and diffusion, the authors of this paper will show that the new nanocrystalline nickel alloy will improve the corrosion resistance, minimize contact wear, and significantly reduce the formation of intermetallics resulting from interdiffusion at interfaces. Both materials will be put through a series of industry standard qualification tests such as mixed flowing gas, thermal shock, humidity cycling, and mechanical vibration to demonstrate the relative effectiveness of each material as an undercoating layer. These qualification tests will be performed in accordance with the Telcordia GR-1217CORE specification and EIA-364 test procedures. This reliability study will also include select test-to-failure sequences to quantify the full achievable performance of the nickel sulfamate relative to the new nanocrystalline nickel alloy as a barrier layer.
  • Keywords
    corrosion resistance; electrical contacts; nanostructured materials; nickel alloys; reliability; wear; EIA-364 test procedures; Telcordia GR-1217CORE specification; contact wear; corrosion resistance; electrical contacts; humidity cycling; mechanical vibration; mixed flowing gas; nanocrystalline nickel alloy undercoating barrier layer; reliability; test-to-failure sequences; thermal shock; Connectors; Contacts; Force; Gold; Nickel alloys; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
  • Conference_Location
    Charleston, SC
  • ISSN
    1062-6808
  • Print_ISBN
    978-1-4244-8174-3
  • Type

    conf

  • DOI
    10.1109/HOLM.2010.5619561
  • Filename
    5619561