K2 the changing role of test in semiconductor manufacturing

Test has traditionally played the role of arbiter of quality, determining as quickly as possible which devices “pass” and which are defective. However, as the gulf widens between IC design and manufacturing, and as manufacturing variability becomes more prevalent, test is being seen more as a source of valuable product data than as just a simple screening mechanism. In this talk we will examine some of the ways in which test is forming a stronger link between VLSI design and manufacturing.