DocumentCode
2818865
Title
Welcome message from general Co-chairs
Author
Kuen-Jong Lee ; Cheng, Tim
Author_Institution
National Cheng Kung University, Taiwan
fYear
2010
fDate
26-29 April 2010
Firstpage
1
Lastpage
1
Abstract
The VLSI-DAT was spun off from the highly influential, 22-year-old, International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) in 2005. In six years, the VLSI-DAT has emerged into the most prominent international event on IC design, automation, and test held in Taiwan. Around 400 academic researchers and industry practitioners from all over the world attend VLSI-DAT each year. The 2010 VLSI-DAT features three keynote speeches:
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location
Hsin Chu, Taiwan
Print_ISBN
978-1-4244-5269-9
Electronic_ISBN
978-1-4244-5271-2
Type
conf
DOI
10.1109/VDAT.2010.5496641
Filename
5496641
Link To Document