Foreword

On behalf of the organizing committee, we would like to welcome you to the 2010 International Symposium on VLSI Design, Automation, and Test (2010 VLSI-DAT). As in the past six years, the Symposium carries on its mission to bring together industry and academic experts to exchange and disseminate their latest R&D findings and accomplishments. The scope of the work presented at the Symposium spans from advanced analog/mixed-signal/RF and SoC design to design automation, testing and manufacturability. The Symposium continues to provide a dynamic environment and synergistic setting for researchers from all over the world to discuss the most current progress with Taiwan´s local experts. This year, the Symposium features three plenary talks, three special topic sessions (one joint session with VLSI-TSA), two invited industrial sessions and one poster session.