DocumentCode
2818919
Title
ESL design and multi-core validation using the System-on-Chip Environment
Author
Chen, Weiwei ; Han, Xu ; Dömer, Rainer
Author_Institution
Center for Embedded Comput. Syst., Univ. of California, Irvine, CA, USA
fYear
2010
fDate
10-12 June 2010
Firstpage
142
Lastpage
147
Abstract
Design at the Electronic System-Level (ESL) tackles the increasing complexity of embedded systems by raising the level of abstraction in system specification and modeling. Aiming at an automated top-down synthesis flow, effective ESL design frameworks are needed in transforming and refining the highlevel design models until a satisfactory multi-processor system-on-chip (MPSoC) implementation is reached. In this paper, we provide an overview of the System-on-Chip Environment (SCE), a SpecC-based ESL framework for heterogeneous MPSoC design. Our SCE framework has been shown effective for its designer-controlled top-down refinement-based design methodology. After reviewing the SCE design flow, this paper highlights our recent extension of the SCE simulation engine to support multi-core parallel simulation for fast validation of large MPSoC designs. We demonstrate the benefits of the parallel simulation using a case study on a H.264 video decoder application.
Keywords
embedded systems; system-on-chip; video coding; H.264 video decoder application; SCE simulation engine; SpecC-based ESL framework; automated top-down synthesis flow; designer-controlled top-down refinement-based design methodology; electronic system-level design; embedded systems; heterogeneous MPSoC design; multicore parallel simulation; multicore validation; multiprocessor system-on-chip implementation; system specification; system-on-chip environment; Application software; Application specific processors; Computational modeling; Computer architecture; Design methodology; Embedded computing; Embedded system; Engines; Hardware; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
High Level Design Validation and Test Workshop (HLDVT), 2010 IEEE International
Conference_Location
Anaheim, FL
ISSN
1552-6674
Print_ISBN
978-1-4244-7805-7
Type
conf
DOI
10.1109/HLDVT.2010.5496646
Filename
5496646
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