DocumentCode
2818959
Title
The relationship of code coverage metrics on high-level and RTL code
Author
Sanguinetti, John ; Zhang, Eugene
Author_Institution
Forte Design Syst., San Jose, CA, USA
fYear
2010
fDate
10-12 June 2010
Firstpage
138
Lastpage
141
Abstract
Code coverage is a standard tool for obtaining an indication of the quality of testing done for a hardware design. This is generally applied to the RTL code for a design. As hardware design is moving to a higher level, it is desirable to apply such tools to the original design source code. The high-level code is synthesized into RTL, which is the traditional design representation to which code coverage is applied. It would be desirable to know how code coverage at the higher level is correlated to code coverage at the RTL. However, line coverage, which is commonly used for high-level code, is known to have little correlation to coverage metrics obtained from the RTL produced from the high-level code. In this exercise, we obtain coverage metrics from a high-level model, produce RTL from it using a high-level synthesis tool, and compare those results with RTL coverage metrics. The correlation obtained for this example is quite good.
Keywords
codes; formal verification; high level synthesis; microprocessor chips; RTL code; code coverage metrics; hardware design; high-level code; high-level synthesis tool; line coverage; register transfer language; Code standards; Current measurement; Hardware; High level synthesis; Load modeling; Logic; Microprocessors; Process design; Read only memory; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
High Level Design Validation and Test Workshop (HLDVT), 2010 IEEE International
Conference_Location
Anaheim, FL
ISSN
1552-6674
Print_ISBN
978-1-4244-7805-7
Type
conf
DOI
10.1109/HLDVT.2010.5496649
Filename
5496649
Link To Document