DocumentCode
2819178
Title
A case study of Time-Multiplexed Assertion Checking for post-silicon debugging
Author
Ming Gao ; Kwang-Ting Cheng
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, Santa Barbara, CA, USA
fYear
2010
fDate
10-12 June 2010
Firstpage
90
Lastpage
96
Abstract
Post-silicon debugging has become the least predictable and most labor-intensive step in the modern design flow at 65nm and below. In this paper, we present a design-for-debug (DfD) technique - named Time-Multiplexed Assertion Checking (TMAC) - for post-silicon bug detection and isolation. By instantiating assertion checkers in an on-chip reconfigurable block (either an embedded FPGA block or a spare programmable core) in a time-multiplexed fashion, TMAC enables hardware implementation of a large number of assertion checkers on-chip with a trivial area overhead. In a case study of an H.264 decoder, a TMAC implementation with eighty time-multiplexed assertion checkers are compared with an ASIC implementation with and without dedicated assertion checkers. Experimental results demonstrate that, among those injected bugs that cannot be detected by a comprehensive set of testbenches for the decoder, those eighty hardware assertion checkers can successfully detect 39.4% of these hard-to-detect bugs. With TMAC, the area overhead is only 1.3%. Moreover, TMAC significantly reduces the time and effort for identifying the root causes of these detected bugs. The case study shows that, on average, the TMAC checkers reduces the bug detection latency by 87 times, and the location of the first assertion violation can help quickly localize the faulty design module.
Keywords
design for testability; field programmable gate arrays; integrated circuit design; integrated circuit testing; system-on-chip; video coding; ASIC implementation; DfD technique; H.264 decoder; TMAC implementation; design flow; design-for-debug technique; embedded FPGA block; faulty design module; hard-to-detect bug; on-chip reconfigurable block; post-silicon bug detection; post-silicon bug isolation; post-silicon debugging; spare programmable core; time-multiplexed assertion checking; Application specific integrated circuits; Computer bugs; Debugging; Decoding; Delay; Design for disassembly; Fault detection; Field programmable gate arrays; Hardware; Testing; Assertion checker; Design for debug; Post-silicon validation; Time-multiplexed;
fLanguage
English
Publisher
ieee
Conference_Titel
High Level Design Validation and Test Workshop (HLDVT), 2010 IEEE International
Conference_Location
Anaheim, FL
ISSN
1552-6674
Print_ISBN
978-1-4244-7805-7
Type
conf
DOI
10.1109/HLDVT.2010.5496657
Filename
5496657
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