• DocumentCode
    2819825
  • Title

    Low-Power FinFET design schemes for NOR address decoders

  • Author

    Turi, Michael A. ; Delgado-Frias, José G. ; Jha, Niraj K.

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
  • fYear
    2010
  • fDate
    26-29 April 2010
  • Firstpage
    74
  • Lastpage
    77
  • Abstract
    This paper presents and evaluates six novel, low-power, FinFET-based design schemes of the conventional NOR address decoder. These schemes differ in front- and back-gate connections and input signal swing. Simulations of these schemes were performed using a 32nm FinFET technology model and the schemes´ performance was evaluated in terms of dynamic current consumption, delay, and leakage current consumption. The Low-Power (LP) scheme, a scheme where the FinFETs´ back gates are reverse-biased for lower-power operation, was used as the base scheme for comparisons. The Shorted-Gate (SG) High Precharge Swing scheme has a better performance tradeoff than the other presented schemes, including the LP scheme. While dynamic power is 10.9% to 11.9% more than the LP scheme, the SG-High Precharge Swing scheme is 48.1% to 59.9% faster and dissipates 93.0% to 99.7% less leakage power than the LP scheme. In addition, the SG-High Precharge Swing scheme requires less supporting hardware as it needs one less voltage level and one less voltage conversion buffer than the LP scheme.
  • Keywords
    MOSFET circuits; NOR circuits; leakage currents; logic design; low-power electronics; FinFET design; NOR address decoders; back-gate connections; dynamic current consumption; front-gate connections; input signal swing; leakage current consumption; shorted-gate high precharge swing; size 32 nm; CMOS technology; Circuits; Clocks; Computer science; Decoding; Delay; Energy consumption; FinFETs; Registers; Voltage; Address decoders; FinFET circuits; high performance; low power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
  • Conference_Location
    Hsin Chu
  • Print_ISBN
    978-1-4244-5269-9
  • Electronic_ISBN
    978-1-4244-5271-2
  • Type

    conf

  • DOI
    10.1109/VDAT.2010.5496695
  • Filename
    5496695