DocumentCode :
281983
Title :
The development of 3D X-ray micro-tomography with sub 100 micron resolution for medical, industrial and biological applications
Author :
Morton, E.J. ; Webb, S. ; Bateman, J.E. ; Clarke, L.J. ; Shelton, C.G.
Author_Institution :
Joint Dept. of Phys., Inst. of Cancer Res., Sutton, UK
fYear :
1989
fDate :
32815
Firstpage :
42552
Lastpage :
42557
Abstract :
Apparatus has been developed for the acquisition of 3D X-ray commuted tomography images in cone-beam geometry. The equipment consists of a microfocal X-ray source operating at photon energies of up to 30 kVp with a focal spot size of 10 μm, a computer-controlled stage for rotating the object, a 2D multi-wire gas proportional X-ray counter and a microcomputer to control image acquisition. Projection data were generated by rotating the object in discrete steps around a single axis until of the order of 100 2D projection images of the object were collected. The projection images were transferred to a VAX 11/750 computer for subsequent 3D reconstruction using a convolution and back-projection algorithm. The reconstructed data were displayed as transaxial, sagittal and coronal planes through the object. The specification of the acquisition hardware is discussed and some projection images together with the corresponding 3D reconstruction of the object are shown with pixel sizes smaller than 100 μm
Keywords :
automatic test equipment; biomedical equipment; computerised picture processing; computerised tomography; diagnostic radiography; medical diagnostic computing; microcomputer applications; radiography; signal processing equipment; 3D X-ray micro-tomography; NDT use; back-projection algorithm; biological use; computer-controlled stage; cone-beam geometry; convolution algorithm; image acquisition apparatus; medical use; microcomputer control; microfocal X-ray source; multi-wire gas proportional X-ray counter; projection images;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Medical Scanning and Imaging Techniques of Value in Non-Destructive Testing, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
198494
Link To Document :
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