Electro-optic sampling of gallium arsenide integrated circuits

Author

Erasme, D. ; Overbury, A.P. ; Parry, G. ; Chapman, A.C.

Author_Institution

Dept. of Electron. & Electr. Eng., Univ. Coll., London, UK

fYear

1989

fDate

32654

Firstpage

42705

Lastpage

42708

Abstract

Short optical pulses are used in a time-delay-sampling arrangement to measure electrical fields via the electro-optic effect. The choice of the electro-optic crystal, of the source of short optical pulses and of the geometry of the optical/electrical interaction allows flexibility in experimental set-up and in the type of electrical waveform to be measured. The authors have selected a very flexible configuration to allow the test of microwave integrated circuits using electronic synchronisation

Keywords

III-V semiconductors; MMIC; electro-optical effects; gallium arsenide; high-speed optical techniques; integrated circuit testing; GaAs; GaAs integrated circuits; MMIC; electrical fields; electrical waveform; electro-optic crystal; electro-optic effect; electro-optic sampling; electronic synchronisation; microwave integrated circuits; monolithic microwave integrated circuits; optical-electrical interaction geometry; semiconductor; short optical pulses; time-delay-sampling arrangement;

fLanguage

English

Publisher

iet

Conference_Titel

Applications of Ultrashort Pulses for Optoelectronics, IEE Colloquium on

Conference_Location

London

Type

conf

Filename

198530

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=282011