Title :
Benchmark circuits for analog and mixed-signal testing
Author :
Kondagunturi, Ramakanth ; Bradley, Eugene ; Maggard, Kristi ; Stroud, Charles
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
This paper proposes a standard set of fault models and establishes acceptable component variations for a new set of benchmark circuits used to evaluate analog and mixed-signal testing techniques
Keywords :
analogue integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; analog testing techniques; benchmark circuits; component variations; fault models; mixed-signal testing; Band pass filters; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Digital filters; Government; MOSFETs; Operational amplifiers; SPICE;
Conference_Titel :
Southeastcon '99. Proceedings. IEEE
Conference_Location :
Lexington, KY
Print_ISBN :
0-7803-5237-8
DOI :
10.1109/SECON.1999.766127
