DocumentCode
2820216
Title
Benchmark circuits for analog and mixed-signal testing
Author
Kondagunturi, Ramakanth ; Bradley, Eugene ; Maggard, Kristi ; Stroud, Charles
Author_Institution
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
fYear
1999
fDate
1999
Firstpage
217
Lastpage
220
Abstract
This paper proposes a standard set of fault models and establishes acceptable component variations for a new set of benchmark circuits used to evaluate analog and mixed-signal testing techniques
Keywords
analogue integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; analog testing techniques; benchmark circuits; component variations; fault models; mixed-signal testing; Band pass filters; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Digital filters; Government; MOSFETs; Operational amplifiers; SPICE;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '99. Proceedings. IEEE
Conference_Location
Lexington, KY
Print_ISBN
0-7803-5237-8
Type
conf
DOI
10.1109/SECON.1999.766127
Filename
766127
Link To Document