DocumentCode :
2820232
Title :
Performance-driven architectural synthesis for distributed register-file microarchitecture considering inter-island delay
Author :
Huang, Juinn-Dar ; Chen, Chia-I ; Hsu, Wan-Ling ; Lin, Yen-Ting ; Jou, Jing-Yang
Author_Institution :
Dept. of Electron. Eng. & Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2010
fDate :
26-29 April 2010
Firstpage :
169
Lastpage :
172
Abstract :
In deep-submicron era, wire delay is becoming the bottleneck while pursuing high system clock speed. Several distributed register (DR) architectures are proposed to cope with this problem by keeping most wires local. In this paper, we propose the distributed register-file microarchitecture with inter-island delay (DRFM-IID). With such delay consideration, synthesis task is inherently more complicated than the one with no inter-island delay concern since uncertain interconnect latency is very likely to make a serious impact on whole system performance. Hence we also develop a performance-driven architectural synthesis framework targeting DRFM-IID, which takes the number of inter-island transfers, transfer criticality and resource utilization into account for better optimization outcomes. The experimental results show that the latency and the number of inter-cluster transfers can be reduced by 26.9% and 37.5% on average; and the latter is a common indicator for power consumption of on-chip communication.
Keywords :
circuit optimisation; integrated circuit interconnections; integrated circuit layout; microprocessor chips; deep-submicron era; distributed register-file microarchitecture; interconnect latency; interisland delay; interisland transfers; on-chip communication; optimization outcomes; performance-driven architectural synthesis; power consumption; resource utilization; system clock speed; transfer criticality; wire delay; Clocks; Delay; Energy consumption; Field programmable gate arrays; Integrated circuit interconnections; Logic; Microarchitecture; Power system interconnection; System performance; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location :
Hsin Chu
Print_ISBN :
978-1-4244-5269-9
Electronic_ISBN :
978-1-4244-5271-2
Type :
conf
DOI :
10.1109/VDAT.2010.5496717
Filename :
5496717
Link To Document :
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