DocumentCode
2820247
Title
Built-in self-test for analog circuits in mixed-signal systems
Author
Maggard, Kristi ; Stroud, Charles
Author_Institution
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
fYear
1999
fDate
1999
Firstpage
225
Lastpage
228
Abstract
A built-in self-test (BIST) approach is presented which is designed to test the analog portion of mixed-signal systems. The BIST approach is evaluated using fault simulation with analog benchmark circuits and is found to consistently provide high fault coverage of all stuck-open and stuck-short faults in the circuit under test
Keywords
automatic testing; built-in self test; circuit simulation; fault simulation; mixed analogue-digital integrated circuits; analog circuits; benchmark circuits; built-in self-test; fault coverage; fault simulation; mixed-signal systems; stuck-open faults; stuck-short faults; Analog circuits; Benchmark testing; Built-in self-test; Circuit faults; Circuit noise; Circuit simulation; Circuit testing; Control systems; Electrical fault detection; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '99. Proceedings. IEEE
Conference_Location
Lexington, KY
Print_ISBN
0-7803-5237-8
Type
conf
DOI
10.1109/SECON.1999.766129
Filename
766129
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