Title :
32 GS/s Soft Decision LSI in 0.13 µm SiGe BiCMOS for Forward Error Correction in Optical Communications
Author :
Kobayashi, T. ; Kametani, S. ; Tagami, H. ; Koguchi, K. ; Mizuochi, T.
Author_Institution :
Inf. Technol. R&D Center, Mitsubishi Electr. Corp., Kamakura, Japan
Abstract :
We have developed a 2-bit 32 GS/s soft decision LSI in 0.13 μm SiGe-BiCMOS. The LSI includes a flash type Analogue-to-Digital converter and an encoder which outputs the soft decision results, which are a hard decision bit and a confidence bit for strong Forward Error Correction. We have confirmed that the LSI has 25 mVpp sensitivity and the LSI enables 2 dB better FEC coding gain than hard decision.
Keywords :
BiCMOS integrated circuits; analogue-digital conversion; forward error correction; large scale integration; optical communication; silicon compounds; BiCMOS; SiGe; flash type analogue-to-digital converter; forward error correction; optical communications; size 0.13 mum; soft decision LSI; word length 2 bit; BiCMOS integrated circuits; Decoding; Forward error correction; Gain; Large scale integration; Parity check codes; Silicon germanium;
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2010 IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7437-0
Electronic_ISBN :
1550-8781
DOI :
10.1109/CSICS.2010.5619672
