DocumentCode :
2820415
Title :
Design of on-chip bus with OCP interface
Author :
Chang, Chin-Yao ; Chang, Yi-Jiun ; Lee, Kuen-Jong ; Yeh, Jen-Chieh ; Lin, Shih-Yin ; Ma, Jui-Liang
Author_Institution :
Dept. of EE, Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2010
fDate :
26-29 April 2010
Firstpage :
211
Lastpage :
214
Abstract :
As more and more IP cores are integrated into an SOC design, the communication flow between IP cores has increased drastically and the efficiency of the on-chip bus has become a dominant factor for the performance of a system. The on-chip bus design can be divided into two parts, namely the interface and the internal architecture of the bus. In this work we adopt the well-defined interface standard, the Open Core Protocol (OCP), and focus on the design of the internal bus architecture. We develop an efficient bus architecture to support most advanced bus functionalities defined in OCP, including burst transactions, lock transactions, pipelined transactions, and out-of-order transactions. We first model and design the on-chip bus with transaction level modeling for the consideration of design flexibility and fast simulation speed. We then implement the RTL models of the bus for synthesis and gate-level simulation. Experimental results show that the proposed TLM model is quite efficient for the whole system simulation and the real implementation can significantly save the communication time.
Keywords :
field buses; integrated circuit design; protocols; system-on-chip; IP cores; OCP interface; RTL models; SOC design; burst transactions; bus functionalities; communication flow; design flexibility; gate-level simulation; interface standard; internal architecture; lock transactions; on-chip bus design; open core protocol; out-of-order transactions; pipelined transactions; simulation speed; transaction level modeling; Communication industry; Contracts; Data communication; Frequency; Master-slave; Out of order; Protocols; System-on-a-chip; Timing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location :
Hsin Chu
Print_ISBN :
978-1-4244-5269-9
Electronic_ISBN :
978-1-4244-5271-2
Type :
conf
DOI :
10.1109/VDAT.2010.5496727
Filename :
5496727
Link To Document :
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