DocumentCode :
2820675
Title :
Placement of temperature sensors under process variations
Author :
Chen, Hsien-Te ; Lo, Wei-Hein ; Chang, Chieh-Chun ; Hwang, TingTing
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2010
fDate :
26-29 April 2010
Firstpage :
271
Lastpage :
274
Abstract :
Variations occur inevitably in temperature sensor from process variations. To tackle the former variations, a relative temperature sensor is proposed and explored in this paper. It eliminates the process variations in temperature measurement and improves area efficiency. The new temperature sensor is able to provide accurate temperature information. Compared with the absolute temperature sensor where maximum temperature error could be as high as 15°C, our relative temperature sensor shows 4.4°C maximum temperature error with 75% area reduction (m = 8) using 1um wide metal connection, and 3.8°C maximum temperature error with 3% area overhead (m = 8) using 10um wide metal connection, in the best case.
Keywords :
temperature measurement; temperature sensors; absolute temperature sensor; maximum temperature error; metal connection; process variations; temperature information; temperature measurement; temperature sensors; Calibration; Circuits; Fluctuations; Manufacturing processes; SPICE; Temperature dependence; Temperature measurement; Temperature sensors; Thermal management; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location :
Hsin Chu
Print_ISBN :
978-1-4244-5269-9
Electronic_ISBN :
978-1-4244-5271-2
Type :
conf
DOI :
10.1109/VDAT.2010.5496741
Filename :
5496741
Link To Document :
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