• DocumentCode
    2820675
  • Title

    Placement of temperature sensors under process variations

  • Author

    Chen, Hsien-Te ; Lo, Wei-Hein ; Chang, Chieh-Chun ; Hwang, TingTing

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    26-29 April 2010
  • Firstpage
    271
  • Lastpage
    274
  • Abstract
    Variations occur inevitably in temperature sensor from process variations. To tackle the former variations, a relative temperature sensor is proposed and explored in this paper. It eliminates the process variations in temperature measurement and improves area efficiency. The new temperature sensor is able to provide accurate temperature information. Compared with the absolute temperature sensor where maximum temperature error could be as high as 15°C, our relative temperature sensor shows 4.4°C maximum temperature error with 75% area reduction (m = 8) using 1um wide metal connection, and 3.8°C maximum temperature error with 3% area overhead (m = 8) using 10um wide metal connection, in the best case.
  • Keywords
    temperature measurement; temperature sensors; absolute temperature sensor; maximum temperature error; metal connection; process variations; temperature information; temperature measurement; temperature sensors; Calibration; Circuits; Fluctuations; Manufacturing processes; SPICE; Temperature dependence; Temperature measurement; Temperature sensors; Thermal management; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
  • Conference_Location
    Hsin Chu
  • Print_ISBN
    978-1-4244-5269-9
  • Electronic_ISBN
    978-1-4244-5271-2
  • Type

    conf

  • DOI
    10.1109/VDAT.2010.5496741
  • Filename
    5496741