DocumentCode :
2820743
Title :
A 1-V low-noise readout front-end for biomedical applications in 0.18-µm CMOS
Author :
Chou, Chien-Jung ; Kuo, Bing-Jye ; Chen, Li-Guang ; Hsiao, Po-Yun ; Lin, Tsung-Hsien
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
fDate :
26-29 April 2010
Firstpage :
295
Lastpage :
298
Abstract :
This paper presents a 1-V and low-noise readout front-end for biomedical applications. The key to this low-voltage and low-power operation is the current-mode instrumentation amplifier (CMIA). To reject the DC offset, an active-RC integrator with the subthreshold-biased PMOS as high resistance is included in the CMIA and forms the offset cancellation loop. The nested-chopper technique is applied to reduce the flicker noise and improve the common-mode rejection ratio (CMRR). A proposed third-order Gm-C low-pass filter (LPF) is incorporated to remove the modulated noise by the choppers. Furthermore, a digitally programmable gain stage is incorporated to provide adjustable gain range for the readout front-end. The overall readout front-end has a bandwidth of 140 Hz and achieves 125-dB CMRR, 90-dB power-supply rejection ratio (PSRR), and 6-nV/rtHz input-referred noise density. The readout front-end is fabricated in a 0.18-μm CMOS process. Total power consumption is 182 μW from a 1-V supply.
Keywords :
CMOS integrated circuits; RC circuits; biomedical electronics; current-mode circuits; instrumentation amplifiers; low-pass filters; low-power electronics; readout electronics; active-RC integrator; biomedical applications; common-mode rejection ratio; current-mode instrumentation amplifier; digitally programmable gain stage; low-noise readout front-end; low-pass filter; low-power operation; nested-chopper technique; power-supply rejection ratio; voltage 1 V; 1f noise; Bandwidth; CMOS process; Choppers; Immune system; Instruments; Low pass filters; Noise cancellation; Operational amplifiers; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location :
Hsin Chu
Print_ISBN :
978-1-4244-5269-9
Electronic_ISBN :
978-1-4244-5271-2
Type :
conf
DOI :
10.1109/VDAT.2010.5496747
Filename :
5496747
Link To Document :
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