DocumentCode
2820908
Title
Lump devices mapping between designer´s schematic and layout extracted schematic in microwave frequency
Author
Lu, Hsin-Chia ; Hsing, Heng-Jui ; Huang, Shao-Hua ; Chang, Yi-Long
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2010
fDate
26-29 April 2010
Firstpage
339
Lastpage
342
Abstract
This paper presents an algorithm that can compare the net-lists between schematic and layout of passive microwave multi-layer circuits. Weight vectors that are related to inductance and capacitance of devices connected to a node are defined for node mapping. However, due to the symmetry of microwave circuits, many possible mapping may be found. We then developed a scoring policy to find the most similar mapping. This checker can help designers to verify layout by comparing the net-list from designer´s schematic and net-list extracted from layout. This algorithm can also provide missing and extra devices in net-list to assist designer to allocate layout errors quickly.
Keywords
circuit layout CAD; microwave integrated circuits; layout errors; layout extracted schematic; lump devices mapping; microwave frequency; passive microwave multi-layer circuits; Algorithm design and analysis; Capacitance; Capacitors; Inductance; Inductors; Integrated circuit layout; Microwave FETs; Microwave circuits; Microwave devices; Microwave frequencies; LVS; Layout; net-list;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location
Hsin Chu
Print_ISBN
978-1-4244-5269-9
Electronic_ISBN
978-1-4244-5271-2
Type
conf
DOI
10.1109/VDAT.2010.5496758
Filename
5496758
Link To Document