Title :
Lump devices mapping between designer´s schematic and layout extracted schematic in microwave frequency
Author :
Lu, Hsin-Chia ; Hsing, Heng-Jui ; Huang, Shao-Hua ; Chang, Yi-Long
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
This paper presents an algorithm that can compare the net-lists between schematic and layout of passive microwave multi-layer circuits. Weight vectors that are related to inductance and capacitance of devices connected to a node are defined for node mapping. However, due to the symmetry of microwave circuits, many possible mapping may be found. We then developed a scoring policy to find the most similar mapping. This checker can help designers to verify layout by comparing the net-list from designer´s schematic and net-list extracted from layout. This algorithm can also provide missing and extra devices in net-list to assist designer to allocate layout errors quickly.
Keywords :
circuit layout CAD; microwave integrated circuits; layout errors; layout extracted schematic; lump devices mapping; microwave frequency; passive microwave multi-layer circuits; Algorithm design and analysis; Capacitance; Capacitors; Inductance; Inductors; Integrated circuit layout; Microwave FETs; Microwave circuits; Microwave devices; Microwave frequencies; LVS; Layout; net-list;
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location :
Hsin Chu
Print_ISBN :
978-1-4244-5269-9
Electronic_ISBN :
978-1-4244-5271-2
DOI :
10.1109/VDAT.2010.5496758