• DocumentCode
    2820908
  • Title

    Lump devices mapping between designer´s schematic and layout extracted schematic in microwave frequency

  • Author

    Lu, Hsin-Chia ; Hsing, Heng-Jui ; Huang, Shao-Hua ; Chang, Yi-Long

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    26-29 April 2010
  • Firstpage
    339
  • Lastpage
    342
  • Abstract
    This paper presents an algorithm that can compare the net-lists between schematic and layout of passive microwave multi-layer circuits. Weight vectors that are related to inductance and capacitance of devices connected to a node are defined for node mapping. However, due to the symmetry of microwave circuits, many possible mapping may be found. We then developed a scoring policy to find the most similar mapping. This checker can help designers to verify layout by comparing the net-list from designer´s schematic and net-list extracted from layout. This algorithm can also provide missing and extra devices in net-list to assist designer to allocate layout errors quickly.
  • Keywords
    circuit layout CAD; microwave integrated circuits; layout errors; layout extracted schematic; lump devices mapping; microwave frequency; passive microwave multi-layer circuits; Algorithm design and analysis; Capacitance; Capacitors; Inductance; Inductors; Integrated circuit layout; Microwave FETs; Microwave circuits; Microwave devices; Microwave frequencies; LVS; Layout; net-list;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
  • Conference_Location
    Hsin Chu
  • Print_ISBN
    978-1-4244-5269-9
  • Electronic_ISBN
    978-1-4244-5271-2
  • Type

    conf

  • DOI
    10.1109/VDAT.2010.5496758
  • Filename
    5496758